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Hprobe equipment

  • Technological survey

Hprobe joins with Imec for SOT-MRAM tester development

Hprobe, a spin-off company from Spintec, joins with Imec to develop advanced magnetic tester equipment for the next generation of MRAM devices based on the Spin Orbit Torque (SOT) effect.

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Bernard DIENY

  • Technological survey

Chief Scientist of Spintec, Bernard DIENY, has received the 2018 IEEE Carrier Achievement Award

Bernard DIENY has received the 2018 IEEE Carrier Achievement Award for contributions to spintronics applications including spin-valves and MRAMs and for strengthening the relationship between magnetics and microelectronics communities.

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Samsung MRAM

  • Technological survey

Samsung starts shipping 28nm embedded MRAM memory

Samsung announced that it has started to mass produce its first embedded MRAM, made using the company's 28nm FD-SOI process. Samsung says that its eMRAM memory module offers higher performance and endurance when compared to eFlash, and can be integrated into existing chips.

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Intel MRAM

  • Technological survey

Intel Says FinFET-Based Embedded MRAM is Production-Ready

SAN FRANCISCO — Intel gave further details on its technique for embedding spin-transfer torque (STT)-MRAM into devices using its 22-nm FinFET process, pronouncing the technology ready for high-volume manufacturing. Embedded MRAM is considered a promising technology for applications such as internet of things (IoT) devices.

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Market analysis

  • Technological survey

Yole sees STT leading the embedded emerging-NVM market

Market analyst firm Yole Developpement presents its latest next-generation memory forecasts in an interesting new article. The company says that following more than 15 years of development, PCM is finally taking off in stand-alone applications due to strong support from Intel and Micron.

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